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Data Management Archives - Driving Excellence for Research Infrastructures and Core Facilities

Staff Visits at ICTS-National Center for Electron Microscopy

Staff Visits at ICTS-National Center for Electron Microscopy

(https://www.cnme.es)  Expertise: Electron Microscopy (EM), Scanning transmission electron microscopy (STEM), conventional transmission electon microscopy (CTEM), scanning electron microscopy (SEM) , X-ray energy dispersive spectroscopy (XEDS), electron energy-loss spectroscopy (EELS), electron correlation and crystalchemistry  Topic you would like to collaborate